bonjour
j’ai testé sur mon portable asus A6BG16E-RWDL
[quote]debian-portable:/home/franck# smartctl -a /dev/hda | grep Load_Cycle_Count
9h43 :193 Load_Cycle_Count 0x0012 098 098 000 Old_age Always - 29779
debian-portable:/home/franck# smartctl -a /dev/hda | grep Load_Cycle_Count
9h44:193 Load_Cycle_Count 0x0012 098 098 000 Old_age Always - 29781
debian-portable:/home/franck# smartctl -a /dev/hda | grep Load_Cycle_Count
9h45:193 Load_Cycle_Count 0x0012 098 098 000 Old_age Always - 29783
debian-portable:/home/franck# hdparm -B 254 /dev/hda
/dev/hda:
setting Advanced Power Management level to 0xFE (254)
debian-portable:/home/franck# smartctl -a /dev/hda | grep Load_Cycle
9h46:193 Load_Cycle_Count 0x0012 098 098 000 Old_age Always - 29785
debian-portable:/home/franck# smartctl -a /dev/hda | grep Load_Cycle
9h47:193 Load_Cycle_Count 0x0012 098 098 000 Old_age Always - 29785
debian-portable:/home/franck# smartctl -a /dev/hda | grep Load_Cycle
9h48:193 Load_Cycle_Count 0x0012 098 098 000 Old_age Always - 29785
debian-portable:/home/franck# exit
exit
franck@debian-portable:~$
[/quote]
j’ai 2 cycles à la minute(je teste depuis hier) et j’ai modifié hdparm comme indiqué et ok .
mon portable en debian etch:
[quote]franck@debian-portable:~$ cat /proc/sys/vm/laptop_mode
0
debian-portable:/home/franck# dpkg -l | grep "acpi"
ii acpi 0.09-1 displays information on ACPI devices
ii acpi-support 0.90-4 scripts for handling many ACPI events
ii acpid 1.0.4-5 Utilities for using ACPI power management
debian-portable:/home/franck# smartctl -a /dev/hda
smartctl version 5.36 [i686-pc-linux-gnu] Copyright © 2002-6 Bruce Allen
Home page is smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Travelstar 80GN family
Device Model: IC25N080ATMR04-0
Serial Number: MRA401K6K4JSBH
Firmware Version: MO4OAD4A
User Capacity: 80 026 361 856 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 3a
Local Time is: Fri Nov 9 00:08:08 2007 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off supp ort.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 69) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_ FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 162 162 033 Pre-fail Always - 1
4 Start_Stop_Count 0x0012 099 099 000 Old_age Always - 1600
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 095 095 000 Old_age Always - 2510
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1303
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 28
193 Load_Cycle_Count 0x0012 098 098 000 Old_age Always - 29771
194 Temperature_Celsius 0x0002 137 137 000 Old_age Always - 40 (Lifetime Min/Max 16/64)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 13
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 4
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 4 occurred at disk power-on lifetime: 409 hours (17 days + 1 hours)
When the command that caused the error occurred, the device was active or idle .
After command completion occurred, registers were:
ER ST SC SN CL CH DH
10 51 01 8b 53 dc e0 Error: IDNF 1 sectors at LBA = 0x00dc538b = 14439307
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
25 00 01 8b 53 dc e0 00 00:00:20.600 READ DMA EXT
25 00 01 85 53 dc e0 00 00:00:20.600 READ DMA EXT
25 00 01 ff 03 fb e0 00 00:00:20.500 READ DMA EXT
25 00 01 00 00 00 e0 00 00:00:20.500 READ DMA EXT
25 00 01 00 00 00 e0 00 00:00:20.200 READ DMA EXT
Error 3 occurred at disk power-on lifetime: 409 hours (17 days + 1 hours)
When the command that caused the error occurred, the device was active or idle .
After command completion occurred, registers were:
ER ST SC SN CL CH DH
10 51 01 85 53 dc e0 Error: IDNF 1 sectors at LBA = 0x00dc5385 = 14439301
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
25 00 01 85 53 dc e0 00 00:00:20.600 READ DMA EXT
25 00 01 ff 03 fb e0 00 00:00:20.500 READ DMA EXT
25 00 01 00 00 00 e0 00 00:00:20.500 READ DMA EXT
25 00 01 00 00 00 e0 00 00:00:20.200 READ DMA EXT
42 00 01 3e c5 fa e0 00 00:00:06.700 READ VERIFY SECTOR(S) EXT
Error 2 occurred at disk power-on lifetime: 409 hours (17 days + 1 hours)
When the command that caused the error occurred, the device was active or idle .
After command completion occurred, registers were:
ER ST SC SN CL CH DH
10 51 01 8b 53 dc e0 Error: IDNF 1 sectors at LBA = 0x00dc538b = 14439307
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
25 00 01 8b 53 dc e0 00 00:03:46.700 READ DMA EXT
25 00 01 85 53 dc e0 00 00:03:46.600 READ DMA EXT
25 00 01 ff 03 fb e0 00 00:03:46.600 READ DMA EXT
25 00 01 00 00 00 e0 00 00:03:46.600 READ DMA EXT
25 00 01 00 00 00 e0 00 00:03:46.200 READ DMA EXT
Error 1 occurred at disk power-on lifetime: 409 hours (17 days + 1 hours)
When the command that caused the error occurred, the device was active or idle .
After command completion occurred, registers were:
ER ST SC SN CL CH DH
10 51 01 85 53 dc e0 Error: IDNF 1 sectors at LBA = 0x00dc5385 = 14439301
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
25 00 01 85 53 dc e0 00 00:03:46.600 READ DMA EXT
25 00 01 ff 03 fb e0 00 00:03:46.600 READ DMA EXT
25 00 01 00 00 00 e0 00 00:03:46.600 READ DMA EXT
25 00 01 00 00 00 e0 00 00:03:46.200 READ DMA EXT
42 00 01 3e c5 fa e0 00 00:03:33.200 READ VERIFY SECTOR(S) EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
[/quote]