J’ai lancé un test long avec smart
Voici le résultat de smartctl -l selftest /dev/hdb
[code]smartctl version 5.38 [i686-pc-linux-gnu] Copyright © 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF READ SMART DATA SECTION ===
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
1 Extended offline Completed without error 00% 7140 -
2 Short offline Completed without error 00% 7077 -
3 Extended offline Completed without error 00% 6944 -
4 Extended offline Completed without error 00% 6937 -
5 Extended offline Aborted by host 80% 6937 -
[/code]
Et le smartctl -a /dev/hdb
[code]smartctl version 5.38 [i686-pc-linux-gnu] Copyright © 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.10 family
Device Model: ST380215A
Serial Number: 9QZ2P788
Firmware Version: 3.AAD
User Capacity: 80 026 361 856 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Thu Jun 4 06:55:21 2009 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 27) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 119 097 006 Pre-fail Always - 214113998
3 Spin_Up_Time 0x0003 097 097 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 099 099 020 Old_age Always - 1416
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 084 060 030 Pre-fail Always - 267613934
9 Power_On_Hours 0x0032 092 092 000 Old_age Always - 7148
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 020 Old_age Always - 1419
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
189 High_Fly_Writes 0x003a 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 055 049 045 Old_age Always - 45 (Lifetime Min/Max 30/49)
194 Temperature_Celsius 0x0022 045 051 000 Old_age Always - 45 (0 13 0 0)
195 Hardware_ECC_Recovered 0x001a 077 068 000 Old_age Always - 110609623
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 31
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 15 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 15 occurred at disk power-on lifetime: 6928 hours (288 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 00 00 00 00 f0 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
25 00 80 f3 83 40 f0 00 00:47:39.964 READ DMA EXT
25 00 b0 2b 85 40 f0 00 00:47:39.963 READ DMA EXT
25 00 48 63 54 41 f0 00 00:47:39.963 READ DMA EXT
25 00 10 2b 54 41 f0 00 00:47:39.957 READ DMA EXT
25 00 50 33 fa 3f f0 00 00:47:39.948 READ DMA EXT
Error 14 occurred at disk power-on lifetime: 6928 hours (288 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 00 00 00 00 f0 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
25 00 80 db 2f 41 f0 00 00:47:38.889 READ DMA EXT
25 00 d8 a3 3e 41 f0 00 00:47:38.887 READ DMA EXT
25 00 00 a3 3d 41 f0 00 00:47:39.420 READ DMA EXT
25 00 00 a3 3d 41 f0 00 00:47:39.419 READ DMA EXT
25 00 00 cb 40 41 f0 00 00:47:39.398 READ DMA EXT
Error 13 occurred at disk power-on lifetime: 6928 hours (288 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 00 00 00 00 f0 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
25 00 00 a3 3d 41 f0 00 00:47:38.889 READ DMA EXT
25 00 00 cb 40 41 f0 00 00:47:38.887 READ DMA EXT
25 00 b0 83 f9 3f f0 00 00:47:38.883 READ DMA EXT
25 00 50 f3 f8 3f f0 00 00:47:38.873 READ DMA EXT
25 00 20 53 e9 3f f0 00 00:47:38.865 READ DMA EXT
Error 12 occurred at disk power-on lifetime: 6928 hours (288 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 00 00 00 00 f0 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
25 00 80 6b 87 40 f0 00 00:47:37.975 READ DMA EXT
25 00 00 c3 3f 41 f0 00 00:47:37.951 READ DMA EXT
25 00 88 db 01 40 f0 00 00:47:37.504 READ DMA EXT
25 00 88 db 01 40 f0 00 00:47:37.498 READ DMA EXT
25 00 98 a3 ff 3f f0 00 00:47:37.491 READ DMA EXT
Error 11 occurred at disk power-on lifetime: 6928 hours (288 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 51 00 00 00 00 f0 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
25 00 88 db 01 40 f0 00 00:47:37.433 READ DMA EXT
25 00 98 a3 ff 3f f0 00 00:47:37.433 READ DMA EXT
25 00 b0 2b 01 40 f0 00 00:47:37.504 READ DMA EXT
25 00 50 3b 00 40 f0 00 00:47:37.498 READ DMA EXT
25 00 00 bb 05 40 f0 00 00:47:37.491 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
1 Extended offline Completed without error 00% 7140 -
2 Short offline Completed without error 00% 7077 -
3 Extended offline Completed without error 00% 6944 -
4 Extended offline Completed without error 00% 6937 -
5 Extended offline Aborted by host 80% 6937 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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Le premier montre qu’il n’y a apparemment pas de problèmes sur le disque par contre, le deuxième m’inquiète un peu plus.
Merci de m’aider à analyser ce log 